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    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
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    DOAB: download the publication
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  2. 2
    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
    Other Authors:
    OAPEN Library: download the publication
    OAPEN Library: description of the publication
    Electronic Book Chapter
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