Search Results - Larissa M. M. Alves

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    Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems by Ernesto B. Benalcázar-Jalkh, Laura F. de Carvalho, Larissa M. M. Alves, Tiago M. B. Campos, Edisa de Oliveira Sousa, Edmara T. P. Bergamo, Paulo G. Coelho, Petra C. Gierthmuehlen, Frank A. Spitznagel, Abbas Zahoui, Estevam A. Bonfante

    Published 2023
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