APA (7th ed.) Citation

SpringerLink (Online service), Hennen, L., Hahn, J., Ladikas, M., Lindner, R., Peissl, W., & van Est, R. (2023). Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance (1st ed. 2023.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-031-10617-0

Chicago Style (17th ed.) Citation

SpringerLink (Online service), Leonhard Hennen, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, and Rinie van Est. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. 1st ed. 2023. Cham: Springer International Publishing : Imprint: Springer, 2023. https://doi.org/10.1007/978-3-031-10617-0.

MLA (9th ed.) Citation

SpringerLink (Online service), et al. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. 1st ed. 2023. Springer International Publishing : Imprint: Springer, 2023. https://doi.org/10.1007/978-3-031-10617-0.