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Light Field Imaging for Deflectometry

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Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurem...

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Bibliographic Details
Main Author: Uhlig, David (auth)
Format: Electronic Book Chapter
Language:English
Published: KIT Scientific Publishing 2023
Series:Forschungsberichte aus der Industriellen Informationstechnik
Subjects:
Electrical engineering
phase unwrapping; camera calibration; light field cameral Phasenentfaltung; Kamerakalibrierung; Lichtfeldkamera; surface reconstruction; deflectometry; Oberflächenrekonstruktion; Deflektometrie
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Summary:Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.
Physical Description:1 electronic resource (284 p.)
ISBN:KSP/1000159372
Access:Open Access

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