Latest Advancements in Next-Generation Semiconductors: Materials and Devices for Wide Bandgap and 2D Semiconductors

This essential collection, edited by Dr. Zeheng Wang and Dr. Jing-Kai Huang, unveils the latest advancements in semiconductor technology that are considered to be the cornerstone of the modern digital era. Spanning cutting-edge research in semiconductor materials, devices, and systems, this reprint...

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Other Authors: Wang, Zeheng (Editor), Huang, Jingkai (Editor)
Format: Electronic Book Chapter
Language:English
Published: Basel MDPI - Multidisciplinary Digital Publishing Institute 2023
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DOAB: description of the publication
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520 |a This essential collection, edited by Dr. Zeheng Wang and Dr. Jing-Kai Huang, unveils the latest advancements in semiconductor technology that are considered to be the cornerstone of the modern digital era. Spanning cutting-edge research in semiconductor materials, devices, and systems, this reprint is an indispensable guide through the innovative realms of microelectronics and nanotechnology.Dive into expert discussions on device architectures, from high-electron-mobility transistors to innovative designs resistant to extreme conditions. Explore the frontiers of material science and fabrication techniques, witnessing groundbreaking methods that enhance device performance and reliability. Uncover the evolving landscape of energy efficiency and power management, crucial for next-generation telecommunications and electric vehicles. Lastly, immerse yourself in the dynamic world of optoelectronics, where advancements in light-based technologies are redefining possibilities.Bringing together pioneering research papers, this volume is not just an academic resource but a beacon for industry professionals and scholars alike, pointing the way to the future of semiconductor technology. 
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653 |a MTBF 
653 |a quartz flexible accelerometer 
653 |a electric field coupling noise 
653 |a lock-in amplifier circuit 
653 |a AlGaN/GaN 
653 |a high-electron-mobility transistor 
653 |a passivation 
653 |a HfO2 
653 |a power clamp circuit 
653 |a ESD 
653 |a HBM 
653 |a false trigger 
653 |a bulk electron accumulation (BEA) 
653 |a extended superjunction trench gate 
653 |a extended drain (ED) 
653 |a BV and Ron,sp 
653 |a fluorides 
653 |a diamond 
653 |a ultrashort-pulse laser 
653 |a direct laser inscription 
653 |a photoluminescent microbits 
653 |a vacancy clusters 
653 |a Micro-LED 
653 |a metasurface 
653 |a light extraction efficiency 
653 |a angular deflection 
653 |a polarization 
653 |a a-IGZO 
653 |a magnetron sputtering 
653 |a thin-film transistors 
653 |a oxygen vacancy 
653 |a oxygen flow rate 
653 |a band-to-band tunneling (BTBT) 
653 |a linear energy transfer value (LET) 
653 |a single-particle irradiation effect 
653 |a anti-irradiation optimization 
653 |a GaN 
653 |a high electron mobility transistors 
653 |a nanochannel 
653 |a tri-gate 
653 |a dual-gate 
653 |a n/a 
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