Atomic-force Microscopy and Its Applications

• Other Authors: Tański, Tomasz (Editor), Staszuk, Marcin (Editor), Ziębowicz, Bogusław (Editor)
• Format: Electronic Book Chapter
• Language: English
• Published: IntechOpen 2019
• Subjects: Analytical chemistry; atomic force microscopy, nanotechnology, carbon nanotube, adhesion, crime, textile
• Online Access: DOAB: download the publication; DOAB: description of the publication

Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as sp...