Nanoparticle Engineering for Chemical-Mechanical Planarization Fabrication of Next-Generation Nanodevices

Increasing reliance on electronic devices demands products with high performance and efficiency. Such devices can be realized through the advent of nanoparticle technology. This book explains the physicochemical properties of nanoparticles according to each step in the chemical mechanical planarizat...

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Bibliographic Details
Main Author: Paik, Ungyu (auth)
Other Authors: Park, Jea-Gun (auth)
Format: Electronic Book Chapter
Language:English
Published: Taylor & Francis 2009
Subjects:
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DOAB: description of the publication
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LEADER 00000naaaa2200000uu 4500
001 doab_20_500_12854_38106
005 20210210
003 oapen
006 m o d
007 cr|mn|---annan
008 20210210s2009 xx |||||o ||| 0|eng d
020 |a 9780429291890 
020 |a 9781000023220 
020 |a 9780367446062 
020 |a 9781420059113 
020 |a 9780429291890 
020 |a 9781420059137 
040 |a oapen  |c oapen 
024 7 |a 10.1201/9780429291890  |c doi 
041 0 |a eng 
042 |a dc 
072 7 |a TBN  |2 bicssc 
100 1 |a Paik, Ungyu  |4 auth 
700 1 |a Park, Jea-Gun  |4 auth 
245 1 0 |a Nanoparticle Engineering for Chemical-Mechanical Planarization  |b Fabrication of Next-Generation Nanodevices 
260 |b Taylor & Francis  |c 2009 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Increasing reliance on electronic devices demands products with high performance and efficiency. Such devices can be realized through the advent of nanoparticle technology. This book explains the physicochemical properties of nanoparticles according to each step in the chemical mechanical planarization (CMP) process, including dielectric CMP, shallow trend isolation CMP, metal CMP, poly isolation CMP, and noble metal CMP. The authors provide a detailed guide to nanoparticle engineering of novel CMP slurry for next-generation nanoscale devices below the 60nm design rule. This comprehensive text also presents design techniques using polymeric additives to improve CMP performance. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode  |2 cc  |4 https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode 
546 |a English 
650 7 |a Nanotechnology  |2 bicssc 
653 |a Material Sciences 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://library.oapen.org/bitstream/20.500.12657/25193/1/1004898.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/38106  |7 0  |z DOAB: description of the publication