Data-driven Methods for Fault Localization in Process Technology

• मुख्य लेखक: Kühnert, Christian (auth)
• स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
• भाषा: अंग्रेज़ी
• प्रकाशित: KIT Scientific Publishing 2013
• श्रृंखला: Karlsruher Schriften zur Anthropomatik / Lehrstuhl für Interaktive Echtzeitsysteme, Karlsruher Institut für Technologie ; Fraunhofer-Inst. für Optronik, Systemtechnik und Bildauswertung IOSB Karlsruhe
• विषय: Time series; Signal processing; Data Mining; System identification; Causality
• ऑनलाइन पहुंच: DOAB: download the publication; DOAB: description of the publication

Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing...