Phase-Contrast and Dark-Field Imaging

• Auteur principal: Simon Zabler (Ed.) (auth)
• Format: Électronique Chapitre de livre
• Langue: anglais
• Publié: MDPI - Multidisciplinary Digital Publishing Institute 2019
• Sujets: X-ray scattering; Coded-aperture imaging; Talbot-Interferometer; Moiré pattern analysis; Electron Backscatter imaging; Dark-field imaging; Computed Tomography; cultural heritage; X-ray Phase-contrast imaging; medical imaging; image processing: Fourier image analysis
• Accès en ligne: DOAB: download the publication; DOAB: description of the publication

The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field...