APA (7th ed.) Citation

Geydt, P., Dunaevskiy, M. S., & Lähderanta, E. (2017). Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen.

Chicago Style (17th ed.) Citation

Geydt, Pavel, M. S. Dunaevskiy, and Erkki Lähderanta. Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen, 2017.

MLA (9th ed.) Citation

Geydt, Pavel, et al. Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen, 2017.

Warning: These citations may not always be 100% accurate.