Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III-V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...
में बचाया:
| मुख्य लेखक: | |
|---|---|
| अन्य लेखक: | , |
| स्वरूप: | इलेक्ट्रोनिक पुस्तक अध्याय |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
InTechOpen
2017
|
| विषय: | |
| ऑनलाइन पहुंच: | DOAB: download the publication DOAB: description of the publication |
| टैग: |
टैग जोड़ें
कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!
|
इंटरनेट
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
| बोधानक: |
A1234.567 |
|---|---|
| प्रति 1 | उपलब्ध |