Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III-V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...
में बचाया:
मुख्य लेखक: | Geydt, Pavel (auth) |
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अन्य लेखक: | Dunaevskiy, M. S. (auth), Lähderanta, Erkki (auth) |
स्वरूप: | इलेक्ट्रोनिक पुस्तक अध्याय |
भाषा: | अंग्रेज़ी |
प्रकाशित: |
InTechOpen
2017
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विषय: | |
ऑनलाइन पहुंच: | DOAB: download the publication DOAB: description of the publication |
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समान संसाधन
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Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
द्वारा: Geydt, Pavel
प्रकाशित: (2017) -
Nanowires
प्रकाशित: (2010) -
Nanowires Science and Technology
प्रकाशित: (2010) -
Nanowires Recent Advances
प्रकाशित: (2012) -
Nanowires Fundamental Research
प्रकाशित: (2011)