Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III-V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

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Bibliographic Details
Main Author: Geydt, Pavel (auth)
Other Authors: Dunaevskiy, M. S. (auth), Lähderanta, Erkki (auth)
Format: Electronic Book Chapter
Language:English
Published: InTechOpen 2017
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Online Access:DOAB: download the publication
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