Characterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc

• Другие авторы: Zschech, Ehrenfried (Редактор), Sinclair, Robert (Редактор), Martins, Rodrigo (Редактор), Sebastiani, Marco (Редактор), Sartori, Sabrina (Редактор)
• Формат: Электронный ресурс Глава книги
• Язык: английский
• Опубликовано: Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
• Предметы: Technology: general issues; physical vapor deposition; magnetron sputtering; AlN/Al coating; silicon substrate; residual stresses; wafer curvature method; nanoscale residual stress profiling; indentation failure modes; nanoindentation adhesion; intermetallic phases; growth kinetics; Al-Ni system; zinc oxide; nanoparticles; paper transistors; printed electronics; electrolyte-gated transistors; microwave synthesis; oxide dissociation; doping; rare earth ions; upconversion; liquid alloys; 2D materials; thin films; Ga-Sn-Zn alloys; gallium alloys; nanoanalysis; lithium-ion; nickel-manganese-cobalt oxide (NMC); leaching; recycling; recover; degradation; SEM-EDX; Raman spectroscopy; resistive switching memories; multi-level cell; copper oxide; grain boundaries; aluminum oxide; p-type TFT; p-type oxide semiconductors; SnO electrical properties; oxide structure analysis; ToF-SIMS 3D imaging; compositional depth profiling; high aspect ratio (HAR) structures; silicon doped hafnium oxide (HSO) ALD deposition; lateral high aspect ratio (LHAR); ToF-SIMS analysis; n/a
• Online-ссылка: DOAB: download the publication; DOAB: description of the publication

This Special Issue "Characterization of Nanomaterials" collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual sy...