Selected Papers from 2020 IEEE International Conference on High Voltage Engineering (ICHVE 2020)

The 2020 IEEE International Conference on High Voltage Engineering (ICHVE 2020) was held on 6-10 September 2020 in Beijing, China. The conference was organized by the Tsinghua University, China, and endorsed by the IEEE Dielectrics and Electrical Insulation Society. This conference has attracted a g...

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Bibliographic Details
Other Authors: Fofana, Issouf (Editor), Zhang, Bo (Editor)
Format: Electronic Book Chapter
Language:English
Published: Basel MDPI - Multidisciplinary Digital Publishing Institute 2023
Subjects:
SF6
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520 |a The 2020 IEEE International Conference on High Voltage Engineering (ICHVE 2020) was held on 6-10 September 2020 in Beijing, China. The conference was organized by the Tsinghua University, China, and endorsed by the IEEE Dielectrics and Electrical Insulation Society. This conference has attracted a great deal of attention from researchers around the world in the field of high voltage engineering. The forum offered the opportunity to present the latest developments and different emerging challenges in high voltage engineering, including the topics of ultra-high voltage, smart grids, and insulating materials. 
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653 |a AC-DC combined voltage 
653 |a oil-paper insulation 
653 |a creepage discharge 
653 |a OS-ELM 
653 |a pattern recognition 
653 |a grounding 
653 |a discharge channel 
653 |a X-ray 
653 |a successive impulse 
653 |a gray information 
653 |a transient analysis model 
653 |a power cable 
653 |a fault location 
653 |a sheath current 
653 |a traveling wave 
653 |a unsupervised learning 
653 |a micro and nanoparticles 
653 |a adding order 
653 |a dielectric properties 
653 |a AC breakdown strength 
653 |a current transformer 
653 |a finite element analysis 
653 |a electro-thermal coupling 
653 |a thermal field 
653 |a oil-film dielectric 
653 |a accumulative effect 
653 |a time-domain dielectric response 
653 |a matrix pencil algorithm 
653 |a extended Debye model 
653 |a finite element 
653 |a composite insulator 
653 |a electric field strength 
653 |a operating state 
653 |a pollution flashover 
653 |a ZnO varistors 
653 |a DC aging 
653 |a double Schottky barrier 
653 |a point defects 
653 |a cable accessories 
653 |a infrared image processing 
653 |a Faster RCNN 
653 |a Mean-Shift algorithm 
653 |a smart condition diagnosis 
653 |a polyethylene 
653 |a micro/nanocomposite 
653 |a hexagonal boron nitride 
653 |a charge transport 
653 |a DC breakdown 
653 |a orientation 
653 |a trap characteristics 
653 |a discharge channel morphology characteristics 
653 |a critical breakdown field strength 
653 |a residual resistivity 
653 |a X-ray imaging technology 
653 |a UHV GIL 
653 |a transient voltage 
653 |a on-line monitoring system 
653 |a UWB voltage sensing 
653 |a sulfur hexafluoride 
653 |a SF6 
653 |a insulation 
653 |a dielectric medium 
653 |a SF6-free 
653 |a SF6-alternative 
653 |a fluoroketone 
653 |a fluoronitrile 
653 |a high soil resistivity 
653 |a soil discharge 
653 |a X-ray imaging 
653 |a super absorbent polymer 
653 |a impulse discharge performance 
653 |a gas insulated switchgear 
653 |a mechanical defect 
653 |a vibration 
653 |a detection and diagnosis 
653 |a contamination flashover 
653 |a the local arc 
653 |a low pressure 
653 |a optical diagnostic method 
653 |a n/a 
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