Effect of EDX accelerating voltage on ZnO thin film doped with sodium / Benedict Wen Cheun Au ... [et al.]

In recent years, owing to its unique properties, ZnO has been researched extensively for a wide range of applications including sensors, transistors and solar cells. In this work, ZnO thin film doped with sodium (ZnO:Na) was characterized using Field Emission-Scanning Electron Microscopy (FESEM) and...

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Main Authors: Wen, Benedict Cheun Au (Author), Kah, Yoong Chan (Author), Siow, Woon Ng (Author), Fong, Kwong Yam (Author)
Format: Book
Published: Universiti Teknologi MARA Cawangan Pahang, 2018.
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LEADER 00000 am a22000003u 4500
001 repouitm_31335
042 |a dc 
100 1 0 |a Wen, Benedict Cheun Au  |e author 
700 1 0 |a Kah, Yoong Chan  |e author 
700 1 0 |a Siow, Woon Ng  |e author 
700 1 0 |a Fong, Kwong Yam  |e author 
245 0 0 |a Effect of EDX accelerating voltage on ZnO thin film doped with sodium / Benedict Wen Cheun Au ... [et al.] 
260 |b Universiti Teknologi MARA Cawangan Pahang,   |c 2018. 
500 |a https://ir.uitm.edu.my/id/eprint/31335/1/31335.pdf 
520 |a In recent years, owing to its unique properties, ZnO has been researched extensively for a wide range of applications including sensors, transistors and solar cells. In this work, ZnO thin film doped with sodium (ZnO:Na) was characterized using Field Emission-Scanning Electron Microscopy (FESEM) and Energy Dispersive X-Ray Spectroscopy (EDX). The FESEM image of the ZnO:Na film implies crystal growth at different orientations. The surface composition of the ZnO :Na film with approximately 350 nm thickness was investigated by EDX as a function of accelerating voltage ranging from 5 kV to 15 kV. The EDX spectra revealed that 7 kV is the most appropriate accelerating voltage for extracting elemental composition of the ZnO:Na films, which exclude the detection of the underlying substrate elements. A rectifying structure made up of P-type ZnO :Na film and N-type tin doped indium oxide (ITO) film showed typical rectifying characteristic. 
546 |a en 
690 |a Temperature 
690 |a T Technology (General) 
690 |a TP Chemical technology 
655 7 |a Article  |2 local 
655 7 |a PeerReviewed  |2 local 
787 0 |n https://ir.uitm.edu.my/id/eprint/31335/ 
856 4 1 |u https://ir.uitm.edu.my/id/eprint/31335/  |z Link Metadata