Performance of high-k dielectric material for short channel length MOSFET simulated using silvaco TCAD tools / Fatin Antasha Anizam ... [et al.]

Short channel effect (SCE) occur in the MOSFET devices when the oxide layer became thinner, and the gate length become shorter. The purposed of this study is to find a new dielectric and gate material to replace the conventional oxide which is silicon dioxide (SiO2) and polysilicon as gate material....

Full description

Saved in:
Bibliographic Details
Main Authors: Anizam, Fatin Antasha (Author), Ismail, Lyly Nyl (Author), Sihab, Norsabrina (Author), Mohd Sauki, Nur Sa'adah (Author)
Format: Book
Published: Universiti Teknologi MARA, 2021-10.
Subjects:
Online Access:Link Metadata
Tags: Add Tag
No Tags, Be the first to tag this record!