NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16- nm High Performance (HP) Predictive Technology Model (PTM)...
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| Main Authors: | , , , |
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| Format: | Book |
| Published: |
UiTM Press,
2018-06.
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| Subjects: | |
| Online Access: | Link Metadata |
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Internet
Link Metadata3rd Floor Main Library
| Call Number: |
A1234.567 |
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| Copy 1 | Available |