NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]

• Asıl Yazarlar: Zainudin, M. F. (Yazar), Hussin, H. (Yazar), Karim, J. (Yazar), Halim, A. K. (Yazar)
• Materyal Türü: Kitap
• Baskı/Yayın Bilgisi: UiTM Press, 2018-06.
• Konular: Article; PeerReviewed
• Online Erişim: Link Metadata

Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16- nm High Performance (HP) Predictive Technology Model (PTM)...