Search Results - "Optical Metrology."

Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry by Taudt, Christopher

Subjects: “…Optical Metrology.…”
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Optical coherence tomography for characterization of nanocomposite materials by Schneider, Simon

Subjects: “…optical metrology…”
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Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry by Taudt, Christopher

Subjects: “…optical metrology…”
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DOAB: description of the publication

Optical coherence tomography for characterization of nanocomposite materials by Schneider, Simon

Subjects: “…optical metrology…”
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OAPEN Library: description of the publication

Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry by Taudt, Christopher

Subjects: “…optical metrology…”
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Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

Subjects: “…computer vision; optische Messtechnik; network security; usage control und machine learning; optical metrology; usage control and machine learning…”
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Proceedings of the 2021 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

Subjects: “…computer vision; optische Messtechnik; network security; usage control und machine learning; optical metrology; usage control and machine learning…”
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Proceedings of the 2022 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

Subjects: “…optical metrology; computer vision; Optische Messtechnik; Bildverarbeitung; usage control; network security; machine learning; Usage Control; Netzwerksicherheit; Maschinelles Lernen…”
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Proceedings of the 2022 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory

Subjects: “…optical metrology; computer vision; Optische Messtechnik; Bildverarbeitung; usage control; network security; machine learning; Usage Control; Netzwerksicherheit; Maschinelles Lernen…”
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Structural, Magnetic, Dielectric, Electrical, Optical and Thermal Properties of Nanocrystalline Materials: Synthesis, Characterization and Application

Subjects: “…optical metrology…”
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Optical In-Process Measurement Systems

Subjects: “…optical metrology…”
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