Search Results - "microscopy"

  1. 221
  2. 222
  3. 223
  4. 224
  5. 225
  6. 226
  7. 227
  8. 228

    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
    Subjects: “…scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young's modulus…”
    DOAB: download the publication
    DOAB: description of the publication
    Electronic Book Chapter
  9. 229
  10. 230
  11. 231
  12. 232
  13. 233
  14. 234
  15. 235
  16. 236
  17. 237
  18. 238
  19. 239
  20. 240