Search Results - "microscopy"

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    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
    Subjects: “…scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young's modulus…”
    OAPEN Library: download the publication
    OAPEN Library: description of the publication
    Electronic Book Chapter
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