Versions - Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

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    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
    DOAB: download the publication
    DOAB: description of the publication
    Electronic Book Chapter

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  2. 2
    Cover Image

    Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires by Geydt, Pavel

    Published 2017
    OAPEN Library: download the publication
    OAPEN Library: description of the publication
    Electronic Book Chapter

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