Nanotechnology for Electronic Materials and Devices

• Otros Autores: Fiorenza, Patrick (Editor), Lo Nigro, Raffaella (Editor), Pécz, Béla (Editor), Eriksson, Jens (Editor)
• Formato: Electrónico Capítulo de libro
• Lenguaje: inglés
• Publicado: Basel MDPI - Multidisciplinary Digital Publishing Institute 2023
• Materias: Technology: general issues; phase transition; thermal oxidation; thermochromism; monolayer MoS2; CVD growth; Sm doping; electrical performance; FET; MoS2; radio-frequency transistors; contact resistance; dual-gate; scanning probe microscopy; scanning capacitance microscopy; 4H-SiC; power-MOSFET; crystallization of silicon; transmission electron microscopy; Moiré fringes; AlN; GaN; atomic layer deposition; sulfurization; XPS; Raman; TEM; C-AFM; photoluminescence; scanning nonlinear dielectric microscopy; boxcar averaging; scanning near-field microwave microscopy; scanning microwave impedance microscopy; WS2; TMD; Sub-2 nm technology; double gate; spectroscopic ellipsometry; combinatorial approach; metal oxides; multilayers; hafnium oxide; iron oxide; ferromagnetism; resistive switching; nanolaminates; n/a
• Acceso en línea: DOAB: download the publication; DOAB: description of the publication

Electronics nanotechnology represents a multidisciplinary field with a very broad range of applications used to address different challenges. This reprint, through eleven original research articles, aims to acknowledge recent developments related to the fabrication and applications of nanomaterials:...