Yuan, K., & Le, V. (2014). Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रYuan, Kun, और Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014.
एमएलए (9वां संस्करण) प्रशस्ति पत्रYuan, Kun, और Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014.
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