Scanning Electron Microscopy

Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging b...

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Bibliográfalaš dieđut
Eará dahkkit: Kazmiruk, Viacheslav (Doaimmaheaddji)
Materiálatiipa: Elektrovnnalaš Girjji oassi
Giella:eaŋgalasgiella
Almmustuhtton: IntechOpen 2012
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3rd Floor Main Library

oažžasuvvan: 3rd Floor Main Library
Hildobáiki: A1234.567
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