Scanning Electron Microscopy
Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging b...
Kaydedildi:
| Diğer Yazarlar: | |
|---|---|
| Materyal Türü: | Elektronik Kitap Bölümü |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
IntechOpen
2012
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| Konular: | |
| Online Erişim: | DOAB: download the publication DOAB: description of the publication |
| Etiketler: |
Etiketle
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Internet
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
| Yer Numarası: |
A1234.567 |
|---|---|
| Kopya Bilgisi 1 | Kütüphanede |