Ellipsometry Principles and Techniques for Materials Characterization

• Autres auteurs: Wahaia, Faustino (Éditeur intellectuel)
• Format: Électronique Chapitre de livre
• Langue: anglais
• Publié: IntechOpen 2017
• Sujets: Laser physics; polarization, growth mechanism, dusty plasma, classification, monitoring
• Accès en ligne: DOAB: download the publication; DOAB: description of the publication

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...