Ellipsometry Principles and Techniques for Materials Characterization
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...
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Format: | Électronique Chapitre de livre |
Langue: | anglais |
Publié: |
IntechOpen
2017
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Accès en ligne: | DOAB: download the publication DOAB: description of the publication |
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DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
Cote: |
A1234.567 |
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