Ellipsometry Principles and Techniques for Materials Characterization
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...
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| Andere auteurs: | |
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| Formaat: | Elektronisch Hoofdstuk |
| Taal: | Engels |
| Gepubliceerd in: |
IntechOpen
2017
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| Onderwerpen: | |
| Online toegang: | DOAB: download the publication DOAB: description of the publication |
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| Samenvatting: | Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization. |
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| Fysieke beschrijving: | 1 electronic resource (162 p.) |
| ISBN: | 65558 9789535136248 9789535136231 9789535145929 |
| Toegang: | Open Access |