Ellipsometry Principles and Techniques for Materials Characterization

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the ac...

Full description

Saved in:
Bibliographic Details
Other Authors: Wahaia, Faustino (Editor)
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2017
Subjects:
Online Access:DOAB: download the publication
DOAB: description of the publication
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000naaaa2200000uu 4500
001 doab_20_500_12854_129797
005 20231201
003 oapen
006 m o d
007 cr|mn|---annan
008 20231201s2017 xx |||||o ||| 0|eng d
020 |a 65558 
020 |a 9789535136248 
020 |a 9789535136231 
020 |a 9789535145929 
040 |a oapen  |c oapen 
024 7 |a 10.5772/65558  |c doi 
041 0 |a eng 
042 |a dc 
072 7 |a PHJL  |2 bicssc 
100 1 |a Wahaia, Faustino  |4 edt 
700 1 |a Wahaia, Faustino  |4 oth 
245 1 0 |a Ellipsometry  |b Principles and Techniques for Materials Characterization 
260 |b IntechOpen  |c 2017 
300 |a 1 electronic resource (162 p.) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
506 0 |a Open Access  |2 star  |f Unrestricted online access 
520 |a Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization. 
540 |a Creative Commons  |f https://creativecommons.org/licenses/by/3.0/  |2 cc  |4 https://creativecommons.org/licenses/by/3.0/ 
546 |a English 
650 7 |a Laser physics  |2 bicssc 
653 |a polarization, growth mechanism, dusty plasma, classification, monitoring 
856 4 0 |a www.oapen.org  |u https://mts.intechopen.com/storage/books/5818/authors_book/authors_book.pdf  |7 0  |z DOAB: download the publication 
856 4 0 |a www.oapen.org  |u https://directory.doabooks.org/handle/20.500.12854/129797  |7 0  |z DOAB: description of the publication