Atomic-force Microscopy and Its Applications

• अन्य लेखक: Tański, Tomasz (संपादक), Staszuk, Marcin (संपादक), Ziębowicz, Bogusław (संपादक)
• स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
• भाषा: अंग्रेज़ी
• प्रकाशित: IntechOpen 2019
• विषय: Analytical chemistry; atomic force microscopy, nanotechnology, carbon nanotube, adhesion, crime, textile
• ऑनलाइन पहुंच: DOAB: download the publication; DOAB: description of the publication

Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as sp...