Deformation Behavior of Thin Metallic Wires under Tensile and Torsional Loadings

• मुख्य लेखक: Chen, Ying (auth)
• स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
• प्रकाशित: KIT Scientific Publishing 2013
• श्रृंखला: Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
• विषय: Technology: general issues; size effects; micro-tension; micro-torsion; strain gradients; Hall-Petch effect
• ऑनलाइन पहुंच: DOAB: download the publication; DOAB: description of the publication

Size effects are widely observed in the mechanics of materials at the micron scale. However, the underlying deformation mechanisms remain ambiguous, particularly in the presence of strain gradients. In this work, combined microstructural investigations and mechanical tests (tension and torsion) were...