Deformation Behavior of Thin Metallic Wires under Tensile and Torsional Loadings

• Yazar: Chen, Ying (auth)
• Materyal Türü: Elektronik Kitap Bölümü
• Baskı/Yayın Bilgisi: KIT Scientific Publishing 2013
• Seri Bilgileri: Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
• Konular: Technology: general issues; size effects; micro-tension; micro-torsion; strain gradients; Hall-Petch effect
• Online Erişim: DOAB: download the publication; DOAB: description of the publication

Size effects are widely observed in the mechanics of materials at the micron scale. However, the underlying deformation mechanisms remain ambiguous, particularly in the presence of strain gradients. In this work, combined microstructural investigations and mechanical tests (tension and torsion) were...