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Imaging methods such as X-ray microscopy are used in non-destructive material analysis to achieve resolutions in the sub micrometer range. Imaging optics are required, for which X-ray lenses are particularly suitable for photon energies above 10 keV. To ensure the universal use of these lenses with...
Kaydedildi:
Yazar: | |
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Materyal Türü: | Elektronik Kitap Bölümü |
Baskı/Yayın Bilgisi: |
KIT Scientific Publishing
2019
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Seri Bilgileri: | Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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Konular: | |
Online Erişim: | DOAB: download the publication DOAB: description of the publication |
Etiketler: |
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Internet
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
Yer Numarası: |
A1234.567 |
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Kopya Bilgisi 1 | Kütüphanede |