Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

• প্রধান লেখক: Marschall, Felix (auth)
• বিন্যাস: বৈদ্যুতিক গ্রন্থের অধ্যায়
• প্রকাশিত: KIT Scientific Publishing 2014
• মালা: Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
• বিষয়গুলি: Technology: general issues; Röntgenmikroskopie; OptikX-ray microscopy; Vollfeldmikroskopie; Mikrostrukturtechnik; refraktive Linse; full-field-microscopy; refractive lens; optics; microstructure technology
• অনলাইন ব্যবহার করুন: DOAB: download the publication; DOAB: description of the publication

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...