Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV
In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...
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| Format: | Elektronski Book Chapter |
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KIT Scientific Publishing
2014
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| Serija: | Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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| Teme: | |
| Online dostop: | DOAB: download the publication DOAB: description of the publication |
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| Izvleček: | In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm |
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| Fizični opis: | 1 electronic resource (IX, 126 p. p.) |
| ISBN: | KSP/1000043064 9783731502630 |
| Dostop: | Open Access |