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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

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Bibliographic Details
Main Author: Marschall, Felix (auth)
Format: Electronic Book Chapter
Published: KIT Scientific Publishing 2014
Series:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
Subjects:
Technology: general issues
Röntgenmikroskopie
OptikX-ray microscopy
Vollfeldmikroskopie
Mikrostrukturtechnik
refraktive Linse
full-field-microscopy
refractive lens
optics
microstructure technology
Online Access:DOAB: download the publication
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Summary:In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm
Physical Description:1 electronic resource (IX, 126 p. p.)
ISBN:KSP/1000043064
9783731502630
Access:Open Access

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