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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखक: Marschall, Felix (auth)
स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
प्रकाशित: KIT Scientific Publishing 2014
श्रृंखला:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
विषय:
Technology: general issues
Röntgenmikroskopie
OptikX-ray microscopy
Vollfeldmikroskopie
Mikrostrukturtechnik
refraktive Linse
full-field-microscopy
refractive lens
optics
microstructure technology
ऑनलाइन पहुंच:DOAB: download the publication
DOAB: description of the publication
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विवरण
सारांश:In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm
भौतिक वर्णन:1 electronic resource (IX, 126 p. p.)
आईएसबीएन:KSP/1000043064
9783731502630
अभिगमन:Open Access

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