Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

• Yazar: Marschall, Felix (auth)
• Materyal Türü: Elektronik Kitap Bölümü
• Baskı/Yayın Bilgisi: KIT Scientific Publishing 2014
• Seri Bilgileri: Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
• Konular: Technology: general issues; Röntgenmikroskopie; OptikX-ray microscopy; Vollfeldmikroskopie; Mikrostrukturtechnik; refraktive Linse; full-field-microscopy; refractive lens; optics; microstructure technology
• Online Erişim: DOAB: download the publication; DOAB: description of the publication

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a...