Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution
Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the...
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| Autore principale: | |
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| Natura: | Elettronico Capitolo di libro |
| Lingua: | inglese |
| Pubblicazione: |
KIT Scientific Publishing
2017
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| Serie: | Schriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie
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| Soggetti: | |
| Accesso online: | DOAB: download the publication DOAB: description of the publication |
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| Riassunto: | Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested. |
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| Descrizione fisica: | 1 electronic resource (XIII, 215 p. p.) |
| ISBN: | KSP/1000070130 9783731506829 |
| Accesso: | Open Access |