Microwave Imaging and Electromagnetic Inverse Scattering Problems

• Main Author: Di Donato, Loreto (auth)
• Other Authors: Morabito, Andrea (auth)
• Format: Electronic Book Chapter
• Language: English
• Published: MDPI - Multidisciplinary Digital Publishing Institute 2020
• Subjects: History of engineering & technology; joint sparsity; magnetic resonance imaging; near-field measurements; rank minimization; compressed sensing; array diagnosis; microwave plasma diagnostics; radar-based breast imaging; image-based approach; contraction integral equation for inversion (CIE-I); nonlinear optimization; contrast-source inversion; electromagnetic inverse scattering problems; nonlinear problem; tomography; RCS estimation; inverse problems; discontinuous Galerkin method (DGM); microwave imaging profilometry; electrical-property tomography; breast imaging; antenna array; finite-difference methods; adjoint inversion methods; Bayesian compressive sensing (BCS); orthogonality sampling method; inverse scattering; linear sampling method; breast cancer; contrast source inversion (CSI); imaging; electromagnetic inverse scattering; antenna testing; stopping criteria; 3D; microwave imaging; Kolmogorov-Smirnov (K-S) test; inverse obstacles problem; 5G communication; inverse source problem
• Online Access: DOAB: download the publication; DOAB: description of the publication

Microwave imaging techniques allow for the development of systems that are able to inspect, identify, and characterize in a noninvasive fashion under different scenarios, ranging from biomedical to subsurface diagnostics as well as from surveillance and security applications to nondestructive evaluation. Such great opportunities, though, are actually severely limited by difficulties arising from the solution of the underlying inverse scattering problem. As a result, ongoing research efforts in this area are devoted to developing inversion strategies and experimental apparatus so that they are as reliable and accurate as possible with respect to reconstruction capabilities and resolution performance, respectively. The intent of this Special Issue is to present the experiences of leading scientists in the electromagnetic inverse scattering community, as well as to serve as an assessment tool for people who are new to the area of microwave imaging and electromagnetic inverse scattering problems.