RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

• मुख्य लेखक: Müller, Daniel (auth)
• स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
• भाषा: अंग्रेज़ी
• प्रकाशित: KIT Scientific Publishing 2018
• श्रृंखला: Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
• विषय: Technology: general issues; On-Wafer Measurements; Monolithic Microwave Integrated Circuits; Halbleiterschaltungen; Messtechnik; Hochfrequenztechnik; Electromagnetic Field Simulation; Elektromagnetische Feldsimulation; Radio Frequency
• ऑनलाइन पहुंच: DOAB: download the publication; DOAB: description of the publication

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...