RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
KIT Scientific Publishing
2018
|
| Series: | Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
|
| Subjects: | |
| Online Access: | DOAB: download the publication DOAB: description of the publication |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000naaaa2200000uu 4500 | ||
|---|---|---|---|
| 001 | doab_20_500_12854_58448 | ||
| 005 | 20210212 | ||
| 003 | oapen | ||
| 006 | m o d | ||
| 007 | cr|mn|---annan | ||
| 008 | 20210212s2018 xx |||||o ||| 0|eng d | ||
| 020 | |a KSP/1000084392 | ||
| 020 | |a 9783731508229 | ||
| 040 | |a oapen |c oapen | ||
| 024 | 7 | |a 10.5445/KSP/1000084392 |c doi | |
| 041 | 0 | |a eng | |
| 042 | |a dc | ||
| 072 | 7 | |a TB |2 bicssc | |
| 100 | 1 | |a Müller, Daniel |4 auth | |
| 245 | 1 | 0 | |a RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| 260 | |b KIT Scientific Publishing |c 2018 | ||
| 300 | |a 1 electronic resource (XII, 180 p. p.) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik | |
| 506 | 0 | |a Open Access |2 star |f Unrestricted online access | |
| 520 | |a Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. | ||
| 540 | |a Creative Commons |f https://creativecommons.org/licenses/by-sa/4.0/ |2 cc |4 https://creativecommons.org/licenses/by-sa/4.0/ | ||
| 546 | |a English | ||
| 650 | 7 | |a Technology: general issues |2 bicssc | |
| 653 | |a On-Wafer Measurements | ||
| 653 | |a Monolithic Microwave Integrated Circuits | ||
| 653 | |a Halbleiterschaltungen | ||
| 653 | |a Messtechnik | ||
| 653 | |a Hochfrequenztechnik | ||
| 653 | |a Electromagnetic Field Simulation | ||
| 653 | |a Elektromagnetische Feldsimulation | ||
| 653 | |a Radio Frequency | ||
| 856 | 4 | 0 | |a www.oapen.org |u https://www.ksp.kit.edu/9783731508229 |7 0 |z DOAB: download the publication |
| 856 | 4 | 0 | |a www.oapen.org |u https://directory.doabooks.org/handle/20.500.12854/58448 |7 0 |z DOAB: description of the publication |