RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...
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| Auteur principal: | |
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| Format: | Électronique Chapitre de livre |
| Langue: | anglais |
| Publié: |
KIT Scientific Publishing
2018
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| Collection: | Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
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| Sujets: | |
| Accès en ligne: | DOAB: download the publication DOAB: description of the publication |
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