Rietveld Refinement in the Characterization of Crystalline Materials

• Hoofdauteur: Igor Djerdj (Ed.) (auth)
• Formaat: Elektronisch Hoofdstuk
• Taal: Engels
• Gepubliceerd in: MDPI - Multidisciplinary Digital Publishing Institute 2019
• Onderwerpen: Chemistry; Rietveld method; Structural characterization; Microstructural analysis; Crystalline materials; Structural materials; X-ray and neutron diffraction; Functional materials
• Online toegang: DOAB: download the publication; DOAB: description of the publication

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.