Rietveld Refinement in the Characterization of Crystalline Materials

• Yazar: Igor Djerdj (Ed.) (auth)
• Materyal Türü: Elektronik Kitap Bölümü
• Dil: İngilizce
• Baskı/Yayın Bilgisi: MDPI - Multidisciplinary Digital Publishing Institute 2019
• Konular: Chemistry; Rietveld method; Structural characterization; Microstructural analysis; Crystalline materials; Structural materials; X-ray and neutron diffraction; Functional materials
• Online Erişim: DOAB: download the publication; DOAB: description of the publication

This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.