Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

• Päätekijä: Niknahad, Mahtab (auth)
• Aineistotyyppi: Elektroninen Kirjan osa
• Kieli: englanti
• Julkaistu: KIT Scientific Publishing 2013
• Sarja: Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung
• Aiheet: Technology: general issues; Space; High reliability; FPGA; Redundancy; Single Event Upset
• Linkit: DOAB: download the publication; DOAB: description of the publication

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...