Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...
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| Format: | Elektronički Poglavlje knjige |
| Jezik: | engleski |
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KIT Scientific Publishing
2013
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| Serija: | Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung
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| Online pristup: | DOAB: download the publication DOAB: description of the publication |
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| 100 | 1 | |a Niknahad, Mahtab |4 auth | |
| 245 | 1 | 0 | |a Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| 260 | |b KIT Scientific Publishing |c 2013 | ||
| 300 | |a 1 electronic resource (IX, 146 p. p.) | ||
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| 490 | 1 | |a Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung | |
| 506 | 0 | |a Open Access |2 star |f Unrestricted online access | |
| 520 | |a Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. | ||
| 540 | |a Creative Commons |f https://creativecommons.org/licenses/by-nc-nd/4.0/ |2 cc |4 https://creativecommons.org/licenses/by-nc-nd/4.0/ | ||
| 546 | |a English | ||
| 650 | 7 | |a Technology: general issues |2 bicssc | |
| 653 | |a Space | ||
| 653 | |a High reliability | ||
| 653 | |a FPGA | ||
| 653 | |a Redundancy | ||
| 653 | |a Single Event Upset | ||
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| 856 | 4 | 0 | |a www.oapen.org |u https://directory.doabooks.org/handle/20.500.12854/61792 |7 0 |z DOAB: description of the publication |