X-ray optics made by X-ray lithography: Process optimization and quality control

Grating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample's microstructure without the need for ultrahigh spatial resolution. The technique relies on grating st...

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Detalles Bibliográficos
Autor principal: Koch, Frieder Johannes (auth)
Formato: Electrónico Capítulo de libro
Lenguaje:inglés
Publicado: KIT Scientific Publishing 2017
Colección:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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Acceso en línea:DOAB: download the publication
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Sumario:Grating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample's microstructure without the need for ultrahigh spatial resolution. The technique relies on grating structures with micrometric periods and extreme aspect ratio - their fabrication by X-ray lithography with optimal structure quality is the topic of this work.
Descripción Física:1 electronic resource (X, 138 p. p.)
ISBN:KSP/1000070029
9783731506799
Acceso:Open Access