X-ray optics made by X-ray lithography: Process optimization and quality control

Grating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample's microstructure without the need for ultrahigh spatial resolution. The technique relies on grating st...

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Egile nagusia: Koch, Frieder Johannes (auth)
Formatua: Baliabide elektronikoa Liburu kapitulua
Hizkuntza:ingelesa
Argitaratua: KIT Scientific Publishing 2017
Saila:Schriften des Instituts für Mikrostrukturtechnik am Karlsruher Institut für Technologie / Hrsg.: Institut für Mikrostrukturtechnik
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