Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

• অন্যান্য লেখক: Bellitto, Victor (সম্পাদক)
• বিন্যাস: বৈদ্যুতিক গ্রন্থের অধ্যায়
• ভাষা: ইংরেজি
• প্রকাশিত: IntechOpen 2012
• বিষয়গুলি: Spectrum analysis, spectrochemistry, mass spectrometry; Electrochemistry & magnetochemistry
• অনলাইন ব্যবহার করুন: DOAB: download the publication; DOAB: description of the publication

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...