Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...
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| Andre forfattere: | |
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| Format: | Electronisk Book Chapter |
| Sprog: | engelsk |
| Udgivet: |
IntechOpen
2012
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| Fag: | |
| Online adgang: | DOAB: download the publication DOAB: description of the publication |
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Internet
DOAB: download the publicationDOAB: description of the publication
3rd Floor Main Library
| Klassifikationsnummer: |
A1234.567 |
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| Kopi 1 | Tilgængelig |