Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...

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Bibliografiske detaljer
Andre forfattere: Bellitto, Victor (Editor)
Format: Electronisk Book Chapter
Sprog:engelsk
Udgivet: IntechOpen 2012
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3rd Floor Main Library

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Klassifikationsnummer: A1234.567
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