Atomic Force Microscopy Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...
Tallennettuna:
| Muut tekijät: | |
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| Aineistotyyppi: | Elektroninen Kirjan osa |
| Kieli: | englanti |
| Julkaistu: |
IntechOpen
2012
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| Aiheet: | |
| Linkit: | DOAB: download the publication DOAB: description of the publication |
| Tagit: |
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| Yhteenveto: | With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development. |
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| Ulkoasu: | 1 electronic resource (270 p.) |
| ISBN: | 2673 9789535104148 9789535149873 |
| Pääsy: | Open Access |